12th Canadian Powder Diffraction Workshop (CPDW 12)
8th – 11th May 2019, Université du Québec à Trois-Rivières, Trois-Rivières, QC
Wednesday May 8th | ||
10:00-10:15 | Welcome & Introductions | Jacques Huot |
10:15-11:00 | Intro to diffraction, structure factors, reciprocal space; Visualization of reciprocal space with MAX3D software | James F. Britten |
11:15-12:00 | Intro to powder diffraction and the Rietveld Method | Robert B. Von Dreele |
12:00-13:30 | Lunch | All |
13:30-14:15 | Demonstration of GSAS-II software and its functionalities | Robert B. Von Dreele |
14:15-15:00 | Neutron diffraction | Levente Balogh |
15:00-16:30 | Work on practice data sets and individual research problems:
simple Rietveld examples with GSAS-II |
All |
16 :30-18 :00 | Presentation of the Hydrogen Research Institute and visit of the labs | All |
18:00-20:00 | Happy hour | All |
Thursday May 9th | ||
08:30-09:15 | Demonstration of TOPAS software and its functionalities / Overview of GUI and Launch mode in TOPAS | Nathan Henderson |
09:30-10:15 | Analysis of 2D diffraction data with Bruker software suite | James Britten |
10:15-10:30 | Break | All |
10:30-11:15 | Size-strain analysis: concrete examples and use of Topas | Jacques Huot |
11:15-12:00 | Phase ID and search-match with EVA software | Nathan Henderson |
12:00-13:00 | Lunch | All |
13:30-17:00 | Work on practice data sets and individual research problems:
residual stress & texture analysis with 2D diffraction data |
All |
Friday May 10th | ||
08:30-09:15 | Residual stress & texture analysis with GSAS-II | Robert B. Von Dreele |
09:30-10:15 | Sample preparation for powder diffraction | TBD |
10:00-10:30 | Break | All |
10:30-11:15 | Size-strain analysis using GSAS-II | Robert B. Von Dreele |
11:15-12:00 | 2D, 3D techniques for residual stress & texture analysis | James F. Britten |
12:00-13:30 | Lunch | All |
13 :30-17:00 | Work on practice data sets and individual research problems: profile analysis problems with GSAS-II and TOPAS | All |
Saturday May 11th | ||
08:30-09:15 | Micro X-ray Diffraction – Data analysis in two dimensions | Roberta L. Flemming |
09:30-10:15 | Synchrotron radiation | Levente Balogh |
11:15-12:00 | Singular-value decomposition quantitative phase analysis of geological materials by combining Rietveld and elemental analyses | Patrick H.J. Mercier |
12:00-13:00 | Lunch | All |
13:30-15:30 | Work on practice data sets and individual research problems:
analysis multiphase materials, troubleshooting Rietveld refinements |
All |
15 :30-17 :00 | Student presentations (or posters) | Students |